ASTM B748

Plating Thickness By SEM

Purpose: Measure the thickness of a layer or sample via electron microscope

Sample: Any solid material that can but cut to 1” x 1”, mounted, polished, and will not outgas under pressure

Price & Delivery: Contact us for a quote. 

Basic Description: A section of material is mounted, polished, and measured in cross section via electron microscope

Limitations: Sample must be able to be mounted and polished, layers must be distinguishable from one another in either SEI or BEI mode, measurement range must be in the field of view for the SEM

Equipment: Joel 6360-LV Electron Microscope and Oxford X-Max EDS System

Method Publisher: https://www.astm.org/b0748-90r21.html

Keywords:

• SEM/EDS
• Cross Section
• Coating/Plating/Layer

Related Test Methods:

• ASTM B568
• ASTM E1508